M. Pecovska-Gjorgjevich
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2003
1
EE
M. Pecovska-Gjorgjevich,
N. Novkovski
,
E. Atanassova
: Electrical properties of thin RF sputtered Ta
2
O
5
films after constant current stress.
Microelectronics Reliability 43
(2): 235-241 (2003)
Coauthor
Index
1
E. Atanassova
[
1
]
2
N. Novkovski
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
