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| 2003 | ||
|---|---|---|
| 1 | EE | M. Pecovska-Gjorgjevich, N. Novkovski, E. Atanassova: Electrical properties of thin RF sputtered Ta2O5 films after constant current stress. Microelectronics Reliability 43(2): 235-241 (2003) |
| 1 | E. Atanassova | [1] |
| 2 | M. Pecovska-Gjorgjevich | [1] |