| 2004 |
|---|
| 3 | EE | Bruce M. Paine,
Timothy J. Perham,
Stephen Thomas III:
High-resolution transmission electron microscopy on aged InP HBTs.
Microelectronics Reliability 44(7): 1055-1060 (2004) |
| 2003 |
|---|
| 2 | EE | William J. Rowe,
Bruce M. Paine,
Adele E. Schmitz,
Robert H. Walden,
Michael J. Delaney:
Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process.
Microelectronics Reliability 43(6): 845-851 (2003) |
| 1 | EE | Bruce M. Paine,
Ami P. Shah,
Thomas Rust:
The effects of ternary alloys on thermal resistances of HBTs, HEMTs, and laser diodes.
Microelectronics Reliability 43(6): 853-858 (2003) |
