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| 2003 | ||
|---|---|---|
| 1 | EE | William J. Rowe, Bruce M. Paine, Adele E. Schmitz, Robert H. Walden, Michael J. Delaney: Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process. Microelectronics Reliability 43(6): 845-851 (2003) |
| 1 | Michael J. Delaney | [1] |
| 2 | Bruce M. Paine | [1] |
| 3 | William J. Rowe | [1] |
| 4 | Robert H. Walden | [1] |