| 2003 |
|---|
| 3 | EE | C. Gautier,
J. Périnet,
E. Nissou,
D. Laffitte:
New method of qualification applied to optical amplifier with electronics.
Microelectronics Reliability 43(9-11): 1761-1766 (2003) |
| 2 | EE | J. L. Goudard,
X. Boddaert,
J. Périnet,
D. Laffitte:
Reliability of optoelectronics components: towards new qualification practices.
Microelectronics Reliability 43(9-11): 1767-1769 (2003) |
| 2002 |
|---|
| 1 | EE | J. L. Goudard,
P. Berthier,
X. Boddaert,
D. Laffitte,
J. Périnet:
New qualification approach for optoelectronic components.
Microelectronics Reliability 42(9-11): 1307-1310 (2002) |
