| |
| 2003 | ||
|---|---|---|
| 2 | EE | J. L. Goudard, X. Boddaert, J. Périnet, D. Laffitte: Reliability of optoelectronics components: towards new qualification practices. Microelectronics Reliability 43(9-11): 1767-1769 (2003) |
| 2002 | ||
| 1 | EE | J. L. Goudard, P. Berthier, X. Boddaert, D. Laffitte, J. Périnet: New qualification approach for optoelectronic components. Microelectronics Reliability 42(9-11): 1307-1310 (2002) |
| 1 | P. Berthier | [1] |
| 2 | J. L. Goudard | [1] [2] |
| 3 | D. Laffitte | [1] [2] |
| 4 | J. Périnet | [1] [2] |