2001 | ||
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1 | EE | M. J. Martín-Martínez, S. Pérez, D. Pardo, T. González: High injection effects on noise characteristics of Si BJTs and SiGe HBTs. Microelectronics Reliability 41(6): 847-854 (2001) |
1 | T. González | [1] |
2 | M. J. Martín-Martínez | [1] |
3 | D. Pardo | [1] |