M. J. Martín-Martínez
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2001
1
EE
M. J. Martín-Martínez,
S. Pérez
,
D. Pardo
,
T. González
: High injection effects on noise characteristics of Si BJTs and SiGe HBTs.
Microelectronics Reliability 41
(6): 847-854 (2001)
Coauthor
Index
1
T. González
[
1
]
2
D. Pardo
[
1
]
3
S. Pérez
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
