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T. González

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2001
1EEM. J. Martín-Martínez, S. Pérez, D. Pardo, T. González: High injection effects on noise characteristics of Si BJTs and SiGe HBTs. Microelectronics Reliability 41(6): 847-854 (2001)

Coauthor Index

1M. J. Martín-Martínez [1]
2D. Pardo [1]
3S. Pérez [1]

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