Kouhei Ohtani

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2003

1 EE Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara: A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. DATE 2003: 10310-10315

2003
1	EE	Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara: A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. DATE 2003: 10310-10315

Coauthor Index

1 Hideo Fujiwara [1]

2 Satoshi Ohtake [1]