V. V. N. Obreja

List of publications from the DBLP Bibliography Server - FAQ

2003

1 EE K. I. Nuttall, O. Buiu, V. V. N. Obreja: Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability 43(9-11): 1913-1918 (2003)

2003
1	EE	K. I. Nuttall, O. Buiu, V. V. N. Obreja: Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability 43(9-11): 1913-1918 (2003)

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