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K. I. Nuttall

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2003
2EEK. I. Nuttall, O. Buiu, V. V. N. Obreja: Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability 43(9-11): 1913-1918 (2003)
2000
1 W. H. Tang, H. Zeng, K. I. Nuttall, Z. Richardson, E. Simonson, Q. H. Wu: Development of Power Transformer Thermal Models for Oil Temperature Prediction. EvoWorkshops 2000: 195-204

Coauthor Index

1O. Buiu [2]
2V. V. N. Obreja [2]
3Z. Richardson [1]
4E. Simonson [1]
5W. H. Tang [1]
6Q. H. Wu [1]
7H. Zeng [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)