2003 | ||
---|---|---|
2 | EE | K. I. Nuttall, O. Buiu, V. V. N. Obreja: Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability 43(9-11): 1913-1918 (2003) |
2000 | ||
1 | W. H. Tang, H. Zeng, K. I. Nuttall, Z. Richardson, E. Simonson, Q. H. Wu: Development of Power Transformer Thermal Models for Oil Temperature Prediction. EvoWorkshops 2000: 195-204 |
1 | O. Buiu | [2] |
2 | V. V. N. Obreja | [2] |
3 | Z. Richardson | [1] |
4 | E. Simonson | [1] |
5 | W. H. Tang | [1] |
6 | Q. H. Wu | [1] |
7 | H. Zeng | [1] |