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| 2003 | ||
|---|---|---|
| 1 | EE | K. I. Nuttall, O. Buiu, V. V. N. Obreja: Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability 43(9-11): 1913-1918 (2003) |
| 1 | K. I. Nuttall | [1] |
| 2 | V. V. N. Obreja | [1] |