H. S. Nguyen

2006
2	EE	H. S. Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang: Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectronics Reliability 46(8): 1309-1314 (2006)
2003
1		H. S. Nguyen, S. H. Nguyen: Approximated Measures in Construction of Decision Trees from Large Databases. HIS 2003: 595-604

Coauthor Index

1	V. Chandrasekar	[2]
2	Zhe Chen	[2]
3	Z. H. Gan	[2]
4	Ning Jiang	[2]
5	S. G. Mhaisalkar	[2]
6	S. H. Nguyen	[1]
7	K. Prasad	[2]

Colors in the list of coauthors