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Z. H. Gan

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2006
1EEH. S. Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang: Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectronics Reliability 46(8): 1309-1314 (2006)

Coauthor Index

1V. Chandrasekar [1]
2Zhe Chen [1]
3Ning Jiang [1]
4S. G. Mhaisalkar [1]
5H. S. Nguyen [1]
6K. Prasad [1]

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