Z. H. Gan

2006
1	EE	H. S. Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang: Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectronics Reliability 46(8): 1309-1314 (2006)

Coauthor Index

1	V. Chandrasekar	[1]
2	Zhe Chen	[1]
3	Ning Jiang	[1]
4	S. G. Mhaisalkar	[1]
5	H. S. Nguyen	[1]
6	K. Prasad	[1]