2008 | ||
---|---|---|
5 | EE | Drew C. Ness, David J. Lilja: Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages. ACM Great Lakes Symposium on VLSI 2008: 297-302 |
4 | EE | Drew C. Ness, David J. Lilja: Guiding Circuit Level Fault-Tolerance Design with Statistical Methods. DATE 2008: 348-353 |
2007 | ||
3 | EE | Drew C. Ness, Christian J. Hescott, David J. Lilja: Exploring subsets of standard cell libraries to exploit natural fault masking capabilities for reliable logic. ACM Great Lakes Symposium on VLSI 2007: 208-211 |
2 | EE | Christian J. Hescott, Drew C. Ness, David J. Lilja: Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment. DSD 2007: 641-648 |
1 | EE | Christian J. Hescott, Drew C. Ness, David J. Lilja: MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments. ISQED 2007: 917-922 |
1 | Christian J. Hescott | [1] [2] [3] |
2 | David J. Lilja | [1] [2] [3] [4] [5] |