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Drew C. Ness

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2008
5EEDrew C. Ness, David J. Lilja: Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages. ACM Great Lakes Symposium on VLSI 2008: 297-302
4EEDrew C. Ness, David J. Lilja: Guiding Circuit Level Fault-Tolerance Design with Statistical Methods. DATE 2008: 348-353
2007
3EEDrew C. Ness, Christian J. Hescott, David J. Lilja: Exploring subsets of standard cell libraries to exploit natural fault masking capabilities for reliable logic. ACM Great Lakes Symposium on VLSI 2007: 208-211
2EEChristian J. Hescott, Drew C. Ness, David J. Lilja: Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment. DSD 2007: 641-648
1EEChristian J. Hescott, Drew C. Ness, David J. Lilja: MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments. ISQED 2007: 917-922

Coauthor Index

1Christian J. Hescott [1] [2] [3]
2David J. Lilja [1] [2] [3] [4] [5]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)