M. Nelhiebel

2005
1	EE	M. Nelhiebel, J. Wissenwasser, Th. Detzel, A. Timmerer, E. Bertagnolli: Hydrogen-related influence of the metallization stack on characteristics and reliability of a trench gate oxide. Microelectronics Reliability 45(9-11): 1355-1359 (2005)

Coauthor Index

1	E. Bertagnolli	[1]
2	Th. Detzel	[1]
3	A. Timmerer	[1]
4	J. Wissenwasser	[1]