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E. Bertagnolli

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2005
1EEM. Nelhiebel, J. Wissenwasser, Th. Detzel, A. Timmerer, E. Bertagnolli: Hydrogen-related influence of the metallization stack on characteristics and reliability of a trench gate oxide. Microelectronics Reliability 45(9-11): 1355-1359 (2005)

Coauthor Index

1Th. Detzel [1]
2M. Nelhiebel [1]
3A. Timmerer [1]
4J. Wissenwasser [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)