| |
| 2003 | ||
|---|---|---|
| 2 | EE | Masashi Hayashi, Shinji Nakano, Tetsuaki Wada: Dependence of copper interconnect electromigration phenomenon on barrier metal materials. Microelectronics Reliability 43(9-11): 1545-1550 (2003) |
| 1983 | ||
| 1 | EE | Eihachiro Nakamae, Hideo Yamashita, Nobuyuki Kawano, Shinji Nakano: Color computer graphics in magnetic field analysis by means of the finite element method. Computers & Graphics 7(3-4): 295-306 (1983) |
| 1 | Masashi Hayashi | [2] |
| 2 | Nobuyuki Kawano | [1] |
| 3 | Eihachiro Nakamae | [1] |
| 4 | Tetsuaki Wada | [2] |
| 5 | Hideo Yamashita | [1] |