Masashi Hayashi

2003
1	EE	Masashi Hayashi, Shinji Nakano, Tetsuaki Wada: Dependence of copper interconnect electromigration phenomenon on barrier metal materials. Microelectronics Reliability 43(9-11): 1545-1550 (2003)

Coauthor Index

1	Shinji Nakano	[1]
2	Tetsuaki Wada	[1]