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| 2001 | ||
|---|---|---|
| 1 | EE | Hide Murayama, Makoto Yamazaki, Shigeru Nakajima: Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system. Microelectronics Reliability 41(8): 1265-1272 (2001) |
| 1 | Shigeru Nakajima | [1] |
| 2 | Makoto Yamazaki | [1] |