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| 2001 | ||
|---|---|---|
| 1 | EE | Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara: A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. ASP-DAC 2001: 331-334 |
| 1 | Hideo Fujiwara | [1] |
| 2 | Satoshi Ohtake | [1] |
| 3 | Hiroki Wada | [1] |