M. de Murcia

2004
1	EE	M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil: Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. Microelectronics Reliability 44(7): 1077-1085 (2004)

Coauthor Index

1	Y. Akue Allogo	[1]
2	P. Llinares	[1]
3	M. Marin	[1]
4	J. C. Vildeuil	[1]