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| 2004 | ||
|---|---|---|
| 1 | EE | M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil: Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. Microelectronics Reliability 44(7): 1077-1085 (2004) |
| 1 | Y. Akue Allogo | [1] |
| 2 | M. Marin | [1] |
| 3 | M. de Murcia | [1] |
| 4 | J. C. Vildeuil | [1] |