| |
| 2002 | ||
|---|---|---|
| 3 | EE | Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan: Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. Microelectronics Reliability 42(6): 985-989 (2002) |
| 2001 | ||
| 2 | EE | Fuchen Mu, Changhua Tan, Mingzhen Xu: Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions. Microelectronics Reliability 41(1): 129-131 (2001) |
| 1 | EE | Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan: A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. Microelectronics Reliability 41(11): 1909-1913 (2001) |
| 1 | Xiaorong Duan | [1] [3] |
| 2 | Changhua Tan | [1] [2] [3] |
| 3 | Mingzhen Xu | [1] [2] [3] |