Shunjiro Miwa

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2002

1 EE Satoshi Ohtake, Hideo Fujiwara, Shunjiro Miwa: A Method of Test Generation for Path Delay Faults in Balanced Sequential Circuits. VTS 2002: 321-327

2002
1	EE	Satoshi Ohtake, Hideo Fujiwara, Shunjiro Miwa: A Method of Test Generation for Path Delay Faults in Balanced Sequential Circuits. VTS 2002: 321-327

Coauthor Index

1 Hideo Fujiwara [1]

2 Satoshi Ohtake [1]