2005 |
3 | EE | Joydeep Mitra,
Peng Yu,
David Zhigang Pan:
RADAR: RET-aware detailed routing using fast lithography simulations.
DAC 2005: 369-372 |
2 | EE | Satish J. Ranade,
Ramchander Kolluru,
Joydeep Mitra:
Identification of chains of events leading to catastrophic failures of power systems.
ISCAS (5) 2005: 4187-4190 |
2000 |
1 | EE | Kathirgamar Aingaran,
Fabian Klass,
Chin-Man Kim,
Chaim Amir,
Joydeep Mitra,
Eileen You,
Jamil Mohd,
Sai-keung Dong:
Coupling Noise Analysis for VLIS and ULSI Circuits.
ISQED 2000: 485-490 |