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2007 | ||
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2 | EE | N. Sghaier, L. Militaru, M. Trabelsi, N. Yacoubi, A. Souifi: Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectronics Journal 38(4-5): 610-614 (2007) |
2001 | ||
1 | EE | L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond: Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectronics Reliability 41(2): 253-263 (2001) |
1 | G. Brémond | [1] |
2 | A. Chantre | [1] |
3 | M. Mouis | [1] |
4 | N. Sghaier | [2] |
5 | A. Souifi | [1] [2] |
6 | M. Trabelsi | [2] |
7 | N. Yacoubi | [2] |