2001 | ||
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1 | EE | L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond: Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectronics Reliability 41(2): 253-263 (2001) |
1 | G. Brémond | [1] |
2 | L. Militaru | [1] |
3 | M. Mouis | [1] |
4 | A. Souifi | [1] |