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M. Menchise

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2006
2EEP. Tanduo, L. Cola, S. Testa, M. Menchise, A. Mervic: Read disturb in flash memories: reliability case. Microelectronics Reliability 46(9-11): 1439-1444 (2006)
2002
1EEA. Mervic, A. Lanzani, M. Menchise, P. Serra, D. Gerosa: Contact resistivity instability in embedded SRAM memory. Microelectronics Reliability 42(9-11): 1365-1368 (2002)

Coauthor Index

1L. Cola [2]
2D. Gerosa [1]
3A. Lanzani [1]
4A. Mervic [1] [2]
5P. Serra [1]
6P. Tanduo [2]
7S. Testa [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)