| |
| 2006 | ||
|---|---|---|
| 2 | EE | P. Tanduo, L. Cola, S. Testa, M. Menchise, A. Mervic: Read disturb in flash memories: reliability case. Microelectronics Reliability 46(9-11): 1439-1444 (2006) |
| 2002 | ||
| 1 | EE | A. Mervic, A. Lanzani, M. Menchise, P. Serra, D. Gerosa: Contact resistivity instability in embedded SRAM memory. Microelectronics Reliability 42(9-11): 1365-1368 (2002) |
| 1 | L. Cola | [2] |
| 2 | D. Gerosa | [1] |
| 3 | A. Lanzani | [1] |
| 4 | A. Mervic | [1] [2] |
| 5 | P. Serra | [1] |
| 6 | P. Tanduo | [2] |
| 7 | S. Testa | [2] |