S. Testa
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2006
1
EE
P. Tanduo
,
L. Cola
, S. Testa,
M. Menchise
,
A. Mervic
: Read disturb in flash memories: reliability case.
Microelectronics Reliability 46
(9-11): 1439-1444 (2006)
Coauthor
Index
1
L. Cola
[
1
]
2
M. Menchise
[
1
]
3
A. Mervic
[
1
]
4
P. Tanduo
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
