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H. Matsushita

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2008
1EEK. Takeuchi, A. Yoshikawa, M. Komoda, K. Kotani, H. Matsushita, Y. Katsuki, Y. Yamamoto, T. Sato: Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. VLSI Syst. 16(11): 1559-1566 (2008)

Coauthor Index

1Y. Katsuki [1]
2M. Komoda [1]
3K. Kotani [1]
4T. Sato [1]
5K. Takeuchi [1]
6Y. Yamamoto [1]
7A. Yoshikawa [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)