Y. Katsuki

2008
1	EE	K. Takeuchi, A. Yoshikawa, M. Komoda, K. Kotani, H. Matsushita, Y. Katsuki, Y. Yamamoto, T. Sato: Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. VLSI Syst. 16(11): 1559-1566 (2008)

Coauthor Index

1	M. Komoda	[1]
2	K. Kotani	[1]
3	H. Matsushita	[1]
4	T. Sato	[1]
5	K. Takeuchi	[1]
6	Y. Yamamoto	[1]
7	A. Yoshikawa	[1]