P. Marcoux
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2006
1
EE
W. Dauksher
, P. Marcoux,
G. Castleman
: A methodology for the calculation of stress migration in die-level interconnects.
Microelectronics Reliability 46
(2-4): 616-625 (2006)
Coauthor
Index
1
G. Castleman
[
1
]
2
W. Dauksher
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
