G. Castleman
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2006
1
EE
W. Dauksher
,
P. Marcoux
, G. Castleman: A methodology for the calculation of stress migration in die-level interconnects.
Microelectronics Reliability 46
(2-4): 616-625 (2006)
Coauthor
Index
1
W. Dauksher
[
1
]
2
P. Marcoux
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
