| |
| 2006 | ||
|---|---|---|
| 3 | EE | Ralf Siemieniec, H.-J. Schulze, F.-J. Niedernostheide, W. Südkamp, Josef Lutz: Compensation and doping effects in heavily helium-radiated silicon for power device applications. Microelectronics Journal 37(3): 204-212 (2006) |
| 2004 | ||
| 2 | EE | Ralf Siemieniec, Josef Lutz: Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes. Microelectronics Journal 35(3): 259-267 (2004) |
| 2003 | ||
| 1 | EE | Josef Lutz, Martin Domeij: Dynamic avalanche and reliability of high voltage diodes. Microelectronics Reliability 43(4): 529-536 (2003) |
| 1 | Martin Domeij | [1] |
| 2 | F.-J. Niedernostheide | [3] |
| 3 | H.-J. Schulze | [3] |
| 4 | Ralf Siemieniec | [2] [3] |
| 5 | W. Südkamp | [3] |