Martin Domeij
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2003
1
EE
Josef Lutz
, Martin Domeij: Dynamic avalanche and reliability of high voltage diodes.
Microelectronics Reliability 43
(4): 529-536 (2003)
Coauthor
Index
1
Josef Lutz
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
