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| 2002 | ||
|---|---|---|
| 1 | EE | Y. W. Chiu, Y. C. Chan, S. M. Lui: Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects. Microelectronics Reliability 42(12): 1945-1951 (2002) |
| 1 | Y. C. Chan | [1] |
| 2 | Y. W. Chiu | [1] |