| |
| 1987 | ||
|---|---|---|
| 1 | EE | Robert Lisanke, Franc Brglez, Aart J. de Geus, David Gregory: Testability-Driven Random Test-Pattern Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 1082-1087 (1987) |
| 1 | Franc Brglez | [1] |
| 2 | Aart J. de Geus | [1] |
| 3 | David Gregory | [1] |