2005 | ||
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2 | EE | Shih Ping Lin, Chung-Len Lee, Jwu E. Chen: A Scan Matrix Design for Low Power Scan-Based Test. Asian Test Symposium 2005: 224-229 |
1 | EE | Shih Ping Lin, Chung-Len Lee, Jwu E. Chen: Adaptive Encoding Scheme for Test Volume/Time Reduction in SoC Scan Testing. Asian Test Symposium 2005: 324-329 |
1 | Jwu E. Chen | [1] [2] |
2 | Chung-Len Lee | [1] [2] |