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C. L. Lin

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2003
1EER. K. Shiue, L. W. Tsay, C. L. Lin, J. L. Ou: The reliability study of selected Sn-Zn based lead-free solders on Au/Ni-P/Cu substrate. Microelectronics Reliability 43(3): 453-463 (2003)

Coauthor Index

1J. L. Ou [1]
2R. K. Shiue [1]
3L. W. Tsay [1]

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