| |
| 1996 | ||
|---|---|---|
| 1 | EE | Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim: Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42- |
| 1 | Y.-M. Hur | [1] |
| 2 | Y.-H. Kim | [1] |
| 3 | K.-H. Lee | [1] |
| 4 | J.-H. Shin | [1] |
| 5 | Y.-S. Son | [1] |