1996 | ||
---|---|---|
2 | EE | Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim: Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42- |
1994 | ||
1 | K.-H. Lee, K.-F. Mak: ACCEL: A Concurrent Class Extension Language. IFIP Congress (1) 1994: 533-538 |
1 | Y.-M. Hur | [2] |
2 | Y.-H. Kim | [2] |
3 | I.-C. Lim | [2] |
4 | K.-F. Mak | [1] |
5 | J.-H. Shin | [2] |
6 | Y.-S. Son | [2] |