Y.-M. Hur

1996
1	EE	Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim: Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42-

Coauthor Index

1	Y.-H. Kim	[1]
2	K.-H. Lee	[1]
3	I.-C. Lim	[1]
4	J.-H. Shin	[1]
5	Y.-S. Son	[1]