| 2007 |
|---|
| 4 | EE | Duane S. Boning,
Karthik Balakrishnan,
Hong Cai,
Nigel Drego,
Ali Farahanchi,
Karen Gettings,
Daihyun Lim,
Ajay Somani,
Hayden Taylor,
Daniel Truque,
Xiaolin Xie:
Variation.
ISQED 2007: 15-20 |
| 3 | EE | Choongyeun Cho,
Daeik D. Kim,
Jonghae Kim,
Jean-Olivier Plouchart,
Daihyun Lim,
Sangyeun Cho,
Robert Trzcinski:
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology.
ISQED 2007: 699-702 |
| 2005 |
|---|
| 2 | EE | Daihyun Lim,
Jae W. Lee,
Blaise Gassend,
G. Edward Suh,
Marten van Dijk,
Srinivas Devadas:
Extracting secret keys from integrated circuits.
IEEE Trans. VLSI Syst. 13(10): 1200-1205 (2005) |
| 2004 |
|---|
| 1 | EE | Blaise Gassend,
Daihyun Lim,
Dwaine E. Clarke,
Marten van Dijk,
Srinivas Devadas:
Identification and authentication of integrated circuits.
Concurrency - Practice and Experience 16(11): 1077-1098 (2004) |
