2005 | ||
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1 | EE | S. Dueñas, H. Castán, H. García, J. Barbolla, K. Kukli, J. Aarik, M. Ritala, M. Leskelä: Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition. Microelectronics Reliability 45(5-6): 949-952 (2005) |
1 | J. Aarik | [1] |
2 | J. Barbolla | [1] |
3 | H. Castán | [1] |
4 | S. Dueñas | [1] |
5 | H. García | [1] |
6 | K. Kukli | [1] |
7 | M. Ritala | [1] |