| |
| 2003 | ||
|---|---|---|
| 3 | EE | Jon C. Lee, J. H. Chuang: A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis. Microelectronics Reliability 43(9-11): 1687-1692 (2003) |
| 2002 | ||
| 2 | EE | Jon C. Lee, C. H. Chen, David Su, J. H. Chuang: Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation. Microelectronics Reliability 42(9-11): 1707-1710 (2002) |
| 2001 | ||
| 1 | Jon C. Lee, David Su, J. H. Chuang: A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. Microelectronics Reliability 41(9-10): 1551-1556 (2001) | |
| 1 | C. H. Chen | [2] |
| 2 | J. H. Chuang | [1] [2] [3] |
| 3 | David Su | [1] [2] |