S. Lavabre
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1995
1
EE
S. Lavabre,
Yves Bertrand
,
Michel Renovell
,
Christian Landrault
: Test configurations to enhance the testability of sequential circuits.
Asian Test Symposium 1995
: 160-168
Coauthor
Index
1
Yves Bertrand
[
1
]
2
Christian Landrault
[
1
]
3
Michel Renovell
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)