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Victor Lau

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2004
1EEN. H. Yeung, Victor Lau, Y. C. Chan: Bias-HAST on tape ball grid array (TBGA) test pattern. Microelectronics Reliability 44(4): 595-602 (2004)

Coauthor Index

1Y. C. Chan [1]
2N. H. Yeung [1]

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