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| 2003 | ||
|---|---|---|
| 1 | EE | Payman Zarkesh-Ha, S. Lakshminarayann, Ken Doniger, William Loh, Peter Wright: Impact of Interconnect Pattern Density Information on a 90nm Technology ASIC Design Flow. ISQED 2003: 405-409 |
| 1 | Ken Doniger | [1] |
| 2 | William Loh | [1] |
| 3 | Peter Wright | [1] |
| 4 | Payman Zarkesh-Ha | [1] |